Light Reflection Model Of Pixel-based Surface Patch For Shot Peening Coverage Estimation
Author: Xiao-Wei Tu, Claude Perron
Source: Conf Proc: ICSP-10 Tokyo, Japan 2008
Doc ID: 2008128
Year of Publication: 2008
Abstract:
ABSTRACT Nowadays, we need to efficiently control key parameters of the shot-peening process such as shot size, energy and peening angle, to ensure a positive and optimum effect on fatigue life. A good way to help us in adjustment of these parameters is to observe the resulting coverage after peening. Manual measurement and control of peening coverage
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