Effects of the surface treatment on the measured diffraction peak width of Inconel 718
Author: Hoffmeister, Schulze, Hessert, Koenig
Source: Conf Proc 2011: ICSP-11 South Bend, IN USA (pgs. 201-206)
Doc ID: 2011033
Year of Publication: 2011
Abstract:
Abstract
Macroscopic and microscopic residual stresses can be determined by the X-Ray diffraction technique. The macroscopic residual stresses can be deduced from the shift of the diffraction peak position. The diffraction peak widths are a measure of the microscopic residual stresses and are often directly correlated with the cold work of a material. Aspects such as the strain rate or the stress state by which the cold work was induced aren
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