X-ray Diffraction Rietveld Analysis of Shot-peened Duplex Stainless Steel during Isothermal Annealing

Author:  F. Qiang, J. Chuanhai, W. Qi, H. Jun
Source:  Conf Proc 2014: ICSP-12 Goslar, Germany (pgs.277-281)
Doc ID:  2014089
Year of Publication:  2014
Abstract:  
Lattice parameters of shot-peened duplex stainless steel (DSS) S32205 samples at isothermal annealing are obtained by using modified Rietveld method. Lattice parameters of both α-phase and γ-phase are found in decrease with prolonged annealing time. The weight fraction of α-phase, microstructure of both α-phase and γ-phase are discussed during isothermal annealing. The dislocation densities of shot-peened DSS samples at isothermal annealing are calculated on the basis of Williamson-Smallman approach using modified Rietveld method.