Electronics Incorporated - The Shot Peener - Shot Peening Library
Title: Almen Saturation Curve Fitting
Author: Dr. David Kirk
Source: The Shot Peener
Publication year 2002
Document number: 2002089
Number of pages: 23
Abstract:
Data abounds in shot peening. We have Almen arc heights, peening times, sieve analyses, shot weightings, image analysis values, air pressure variations, shot flow rates,
residual stress data, etc. Most of this data is valuable - it cost time and money to produce - and it can all be stored in a readily-accessible format. Data that simply
appears during a controlled process - such as Magnavalve readings during peening - would not normally need to be stored for subsequent analysis. Almen arc heights, on the
other hand, should be stored together with associated variables such as peening time, shot size, shot type, air pressure, stand-off distance, feed rate, etc. Commercial
spreadsheets (such as Microsoft's Excel) are useful for limited data storage but a proper database programme (such as Microsoft's Access) is needed for large data storage
procedures. Most data analysis programs can input data straight from either a spreadsheet or a database.
Vast amounts of data can therefore be accumulated and stored, but it is all useless unless it can be analysed. This analysis must have specific objectives. These
objectives may include:
Presenting data in a palatable format,
Determining required parameters - such as time to achieve a specified Amen arc height,
Investigating unknown relationships between parameters and
Impressing customers!
Data is often presented in tabular form. Tabulation has specific advantages, the chief of which is that actual values are made available. On the other hand it is often
difficult with tabulated data to visualise trends and deviations from those trends. Graphical representation is the main alternative to tabulation. Several formats are
used including histograms, pie charts and X-Y plots. This paper will concentrate on the two-dimensional X-Y plotting of data and the consequent analysis of the data
trends.
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This page last revised: 04/24/2008