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Title: Characterization of Shot Peened Components by X-Ray Diffraction: A Method On Its Way From the Laboratory Into Industrial Prod
Author: Wulf Pfeiffer
Source: Conf Proc: ICSP-9 (pg 414-419)
Publication year 2005
Document number: 2005118
Number of pages: 6
Abstract:
ABSTRACT
A main beneficial effect of shot peening is the creation of compressive residual stresses. Thus, reliable and accurate methods for determining residual stresses are needed
to allow controlling the process, verifying models and assessing strength increasing mechanisms. Since a long time X-ray diffraction (XRD) has been the choice method for
basic residual stress investigations. Due to missing a norm or practice guides being internationally accepted, this method has been hindered to be also the first choice in
case of acceptance tests.
This gap is now going to be closed. A European standard for residual stress determination using X-ray diffraction has been evaluated by an expert group and will be available
shortly. This paper summarizes the basic principles of the method, sketches the range of applications covered by the norm and explains some of the limiting cases defined by
the norm. Special emphasis is given to the relevance of the norm for residual stress investigations on shot peened materials.
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