A New 3D Surface Characterization Method Is More Quantitative and Reproducible Than Traditional Peening Metrology
Author: J. Wheeler, K. Brown, and E. Novak 4D Technology Corporation, 3280 E. Hemisphere Loop, Tucson, AZ 85706, USA
Source: ICSP14 Milan
Doc ID: 2022049
Year of Publication: 2022
Abstract:
Current metrology methods of shot peened surfaces have many shortcomings. 2D stylus methods
are directionally sensitive, can’t measure corners or edges, often difficult to setup, and offer small
overall coverage. 3D microscopes have high resolution and good areal coverage but lack on
portability and can take significant time to capture a single data point. This paper presents a highresolution,
extremely portable 3D optical measurement system for comprehensive, accurate, fast
shop floor assessment of shot peen coverage. A variety of component measurements will be
presented along with studies on accuracy, repeatability, and reproducibility in real-world
environments.
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