Fundamental Aspects of Shot Peening Coverage Control Part One: Formulation of Single and Multiple Impacting

Author:  M Y Abyaneh
Source:  Conf Proc: ICSP-6, (p.438-447)
Doc ID:  1996090
Year of Publication:  1996
Abstract:  
Tow general geometrical/statistical methods of formulating the coverage of a substrate resulting from impacts of shots are presented [Abyaneh MY and Fleischmann M, 'Towe-dimensional transformation on substrates of infinite and finite size, J Electromchem Soc, 138, 2486-2492, 1991]. The first geometrical representation is shown to yield the famous avrami equation [Avrami M, J Chem Phys, 7, 1103, 1939;8, 212, 1940; 9,177,1941] for the coverage by at least a single shot, whereas the second simplifies to the equation first realized by Evans [Evans UR Trans Faraday Soc, 41, 365, 1945]. In this paper it is shown that the generalized form of the second approach is much more powerful technique for the formulation of coverage and can be applied more directly to the problem of overlap of shots than the complicated form of the extended coverage developed by Avrami. The second geometrical method will be used here for formulating the extent to which regions of substrate are subjected to only one, two or a greater number of impacts.