A simple approach would be to require circularity measurements to be applied to a specified number of particles. Computer-based image analysis has been available for decades. The basic equation for circularity (=4*pi*Area/Perimeter squared) gives a value of 1 for a perfect circle and lower values as circularity decreases. Specification could detail an allowed maximum % failing to reach a stated circularity value. The current "sketches" could be analysed to provide a starting point for the stated required minimum circularity. This approach would have the added advantage of being totally objective.