Non-Destructive Monitoring of Surfaces by 3-D Profilometry Using a Power Spectra

Author:  Robert A. Thompson
Source:  US Patent 5,166,885
Doc ID:  1992041
Year of Publication:  1992
Abstract:  
A method for monitoring the surface treatment of substrates is disclosed. The surface treatment, preferably, is shot peening. The surface treatment is monitored through the use of a selective spectral analysis of the 3-D information relating to the 3-D profilometry of the surface treatment on the substrate.