Quality Assurance of Surface Treatments by Analysis of Substrate Surface Line Traces

Author:  Robert A. Thompson, Trent J. Markell
Source:  US Patent 5,204,826
Doc ID:  1993038
Year of Publication:  1993
Abstract:  
A quality assurance of surface treatments, typically with shot peening, by analysis of substrate surface line traces is dosclosed. In particular, line traces are created over the surface treated substrate. these line traces are filtered with a low pass filter to create relative maximums. The coordinates of the relative maximums are determined and the spatial distance between these coordinates are measured and recorded. The actual plastic upset depth of the surface treatment substrate is determined. The surface treatment is then adjusted, if necessary, based upon the values of these spatial distances and actual plastic upset depths.