Light Reflection Model Of Pixel-based Surface Patch For Shot Peening Coverage Estimation

Author:  Xiao-Wei Tu, Claude Perron
Source:  Conf Proc: ICSP-10 Tokyo, Japan 2008
Doc ID:  2008128
Year of Publication:  2008
ABSTRACT Nowadays, we need to efficiently control key parameters of the shot-peening process such as shot size, energy and peening angle, to ensure a positive and optimum effect on fatigue life. A good way to help us in adjustment of these parameters is to observe the resulting coverage after peening. Manual measurement and control of peening coverage

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