Life Outside of Electronics Inc.

Author:  Jack Champaigne, Editor
Source:  The Shot Peener magazine, Vol 33, Issue 3, Summer 2019
Doc ID:  2019025
Year of Publication:  2019
In the pursuit of creating alliances between industry and research in the United States, I have take an interest in the Center for Surface Engineering and Enhancement (CSEE) at Purdue University. Through CSEE, organizations can take advantage of laboratory space and gain access to the academic facilities at Purdue for a myriad of surface enhancement projects, including shot peening. One of CSEE’s first projects is the evaluation of media inspection methods using image analysis. Equipment donated by WS Tyler will determine upper and lower spec limits for all types of media. Data will be presented in conventional histograms,allowing performance to 6σ guidelines. Ervin Industries has agreed to supply media samples and other contributors are being sought. The advantage of image analysis is that it provides not only size information but shape analysis, too. If you are tired of looking through the stereo microscope and counting defective pieces, you will like this new approach. Several job shops have expressed a strong interest since this could be a large time- and cost-savings method.

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